AES – Auger Electron Spectroscopy
CDI – Coherent Diffraction Imaging
CBED – Convergent Beam Electron Diffraction
DTA – Differential Thermal Analysis
ECCI – Electron Channeling Contrast Imaging
PFZ – Precipitate Free Zone
AFS – Atomic Fluorescence Spectrometry
DIGM – Diffusion Induced Grain boundary Migration
TRIP – Transformation Induced Plasticity
ECP – Electron Channeling Pattern
FCC – Face Centered Cubic
BCC – Body Centered Cubic
PC – Primitive Cubic
AGG – Abnormal Grain Growth
HRTEM – High Resolution Transmission Electron Microscopy / Microscope
SCF – Single Crystal Fiber
ODS – Oxide Dispersion Strengthened
HAS – Helium Atom Scattering
CSL – Coincidence Site Lattice
AEM – Analytical Electron Microscope / Microscopy
SEC – Size Exclusion Chromatography
IBA – Ion Beam Analysis
ERDA – Elastic Recoil Detection Analysis
SEM – Scanning Electron Microscope / Microscopy
TEM – Transmission Electron Microscope / Microscopy
OIM – Orientation Imaging Microscopy
ISS – Ion Scattering Spectroscopy
DETA – Dielectric Thermal Analysis
SAED – Selected Area Electron Diffraction
HIP – Hot Isostatic Pressing
GBD – Grain Boundary Dislocation
RIXS – Resonant Inelastic X-ray Scattering
PSN – Particle Stimulated Nucleation
LAC – Linear Absorption Coefficient
SANS – Small Angle Neutron Scattering
RET – Resonance Energy Transfer
EDMR – Electrically Detected Magnetic Resonance
SFE – Stacking Fault Energy
EFTEM – Energy Filtered Transmission Electron Microscopy
HEA – High Entropy Alloy
STEM – Scanning Transmission Electron Microscope
RHEED – Reflection High Energy Electron Diffraction
HCP – Hexagonal Closet Packed
TGA – Thermogravimetric Analysis
ESD – Electron Stimulated Desorption
OES – Optical Emission Spectroscopy
AFM – Atomic Force Microscope / Microscopy
FEM – Field Emission Microscope / Microscopy
DIR – Diffusion Induced Recrystallization
IGA – Intelligent Gravimetric Analyzer
